Nenad Bundaleski

Research Fellow

249 - Ed. I
METROVAC | 244 - Ed. I

(+351) 21 294 85 76 10525

Research Areas

Surface science, particle surface interaction, secondary electron emission, adsorption, surface characterisation by XPS, LEIS, AES, SIMS, WF, charged particle optics

Main publications

N. Bundaleski, S. Petrović, D. Peruško, J. Kovač, A. Zalar,; "Composition of the sputter deposited W-Ti thin films", Appl. Surf. Sci., (2008); 254, 6390.

N. Bundaleski, H. Khemliche, P. Soulisse, P. Roncin, "Grazing incidence diffraction of keV Helium atoms on a Ag(110) surface", Phys. Rev. Lett., (2008); 101, 177601.

N. Bundaleski, J. Trigueiro, A.G. Silva, A.M.C. Moutinho, O.M.N.D. Teodoro, "Influence of the patch field on work function measurements based on the secondary electron emission", J. Appl. Phys.; (2013); 113, 183720.

N. Bundaleski, M. Belhaj, T. Gineste, O.M.N.D. Teodoro, "Calculation of the Angular Dependence of the Total Electron Yield", Vacuum, (2015); 122; 255-259.

J. Trigueiro, W. Lima, N. Bundaleski, O.M.N.D. Teodoro, "XPS spectrometer transmission function optimization by the differential evolution algorithm", J. El. Spec. Rel. Phenom.; (2018); 222; 122-132.