Ana Cristina Silva

Associate Professor
Physics Dept., FCT NOVA

214 - Ed. I
(+351) 21 294 85 76 10552
acs@fct.unl.pt

Research Areas

Applied nano-optics; nanoelectronics; nanostructures and oxides. Surface, interface phenomena, enabling technologies.


Surface, interface and thin films characterization – electronic and optical properties.




Main publications

 


Cunha, J. M. V.; Oliveira, K.; Lontchi, J.; Lopes, T. S.; Curado, M. A.; Barbosa, J. R. S.; Vinhais, C.; Chen, W. C.; Borme, J.; Fonseca, H.; Gaspar, J.; Flandre, D.; Edoff, M.; Silva, A. G.; Teixeira, J. P.; Fernandes, P. A.; Salomé, P. M. P. High-Performance and Industrially Viable Nanostructured SiOx Layers for  Interface Passivation in Thin Film Solar Cells. Solar RRL 5, [2000534]. (2021) https://doi.org/10.1002/solr.202000534


 


Cunha, J. M. V.; Barreiros, M. A.; Curado, M. A.; Lopes, T. S.; Oliveira, K.; Oliveira, A. J. N.; Barbosa, J. R. S.; Vilanova, A.; Brites, M. J.; Mascarenhas, J.; Flandre, D.; Silva, A. G.; Fernandes, P. A.; Salomé, P. M. P. Perovskite Metal–Oxide–Semiconductor Structures for Interface Characterization. Adv. Mater. Interfaces 8, [2101004] (2021).  https://doi.org/10.1002/admi.202101004


 


Curado, M. A.; Teixeira, J. P.; Monteiro, M.; Ribeiro, E. F. M.; Vilão, R. C.; Alberto, H. V.; Cunha, J. M. V.; Lopes, T. S.; Oliveira, K.; Donzel-Gargand O.; Hultqvist, A.; Calderon, S.; Barreiros, M. A.; Chiappim, W.; Leitão, J. P.; Silva, A. G.; Prokscha, T.; Vinhais, C.; Fernandes, P. A.; Salomé, P. M. P. Front passivation of Cu(In,Ga)Se2 solar cells using Al2O3: Culprits and benefits. Appl. Mater. Today 21, 100867. (2020). https://doi.org/10.1016/j.apmt.2020.100867


 


Oliveira, A. J. N.; de Wild, J.; Oliveira, K.; Valença, B. A.; Teixeira, J. P.; Guerreiro, J. R. L.; Abalde-Cela, S.; Lopes, T. S.; Ribeiro, R. M.; Cunha, J. M. V.; Curado, M. A.; Monteiro, M.; Violas, A.; Silva, A. G.; Prado, M.; Fernandes, P. A.; Vermang, B.; Salomé, P. M. P. Encapsulation of Nanostructures in a Dielectric Matrix Providing Optical Enhancement in Ultrathin Solar Cells. Solar RRL 4 (2020). https://doi.org/10.1002/solr.202000310


 


Pereira, D. R.; Magalhães, S.; Díaz-Guerra, C.; Peres, M.; Correia, J. G.; Marques, J. G.; Silva, A. G.; Alves, E.; Cardoso, S.; Freitas, P. P.; Lorenz, K. Estimating the uncertainties of strain and damage analysis by X-ray diffraction in ion implanted MoO3. Nucl. Instrum. Methods Phys. Res. B: Beam Interact. Mater. At. 478, 290-296 (2020). https://doi.org/10.1016/j.nimb.2020.07.016


 


Silva, A. G.; Pedersen, K.; Li, Z.; et al. Growth of aluminum oxide on silicon carbide with an atomically sharp interface. J. Vac. Sci. Technol. A, 35, 01B142 (2017). https://doi.org/10.1116/1.4972774


 


Silva, A. G.; Pedersen, K.; Li, Z. S.; et al. Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si. Appl. Surf. Sci. 353, 1208-1213 (2015). https://doi.org/10.1016/j.apsusc.2015.07.024


 


 


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ORCID: 0000-0001-7590-3042


Scopus Author ID: 37054724200